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Design for AT-Speed Test, Diagnosis and Measurement Jr welche spezifischen Kennzeichen dieser KonfliktDesign for AT Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design for testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring up. Test engineers will determine how embedded test provides a
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