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Doch werden die Antworten auf diese Fragen noch bedeutsamer in einem direkten Vergleich mit einem anderen europäischen Land
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Advanced Verification Techniques MEng. F. Lucka 1Atomare Attribute21"As chip size and complexity continues to grow exponentially, the challenges of functional verification are becoming a critical issue in the electronics industry. It is now commonly heard that logical errors missed during functional verification are the most common cause of chip re spins, and that the costs associated with functional verification are now outweighing the costs of chip design. To cope with these challenges engineers are increasingly
